European test symposium (ETS 2005); proceedings.

IEEE European Test Symposium (10th: 2005: Tallinn, Estonia)

Computer Society Press

2005

230 pages

$184.00

Paperback

TK7874

Thirty-five formal papers from the May 2005 symposium present trends, emerging results, and practical applications in the field of electronic-based circuit and system testing. The authors explore system-on-chip testing, fault and defect models, advanced test generation issues, low cost testing for advanced analog circuits, on- line and BIST techniques for MEMS, validation and molecular electronics, SRAM memory testing, and fault diagnosis. The topics include a unified fault model and test generation procedure for interconnect opens and bridges, on-line testing of MEMS using electro-thermal excitation, a programmable time measurement architecture for embedded memory characterization, and design validation of behavioral VHDL descriptions for arbitrary fault models. No subject index is provided.

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