Design, automation and test in Europe; proceedings; 3v.

Design, Automation and Test in Europe; Conference and Exhibition (2005: Munich, Germany) Ed. by Georges Gielen and Joan Figueras.

Computer Society Press

2004

1348 pages

$429.00

Paperback

QA76.76

Billed as Europe's largest event in the fields of design, automation, and test of electronic circuits and embedded systems, DATE 05 (March 2005, Munich, Germany) taps the "endless quest for faster, less consuming, cheaper and safer electronic products, particularly for the growing consumer and communications markets" (from the foreword). Three volumes of contributions present an abundance of material. Topics related to automotive and biochips topics merited special theme days. Chosen for "best" awards were papers in the fields of CAD, tools, and test; they deal, respectively, with digital ground bounce reduction by phase modulation of the clock; poor man's TBR--a simple model reduction scheme; and wrapper design for testintg IP cores with multiple clock domains. The most outstanding interactive presentation award went to automatic synthesis and simulation of continuous-time sigma-delta modulators. There is no subject index.

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